Octal inverting Buffer/Driver
Members of the Texas Instruments SCOPE [tm] Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to & 8217 F240 and & 8217 BCT240 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port TAP
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin
SCOPE & 63722 Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP,and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs |
